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Atomic Force Microscope
Atomic Force Microscope (AFM) is a state-of-the-art instrument designed for both ease-of-use and robustness. The AFM is a truly multidisciplinary metrology tool and industry standard. An AFM is now easy enough to introduce the beginner to the nanoscale, but ready for advanced research as well.
Digital Data Input Output
Specification:
- Connection – USB
- Scanning DAC
Number – 2
Bits – 24
Frequency – 7 kHz - Control DAC
Number – 2
Bits – 14
Frequency – 2 kHz - ADC
Number – 8
Bits – 14
Frequency – 48 kHz
50 Micron xyz Scanner
Specification:
- Type – Modified tripod
- XY Linearity – < 1%
- XY Range – > 50 μ
- XY resolution – < 10 nm closed loop
< 1 nm open loop - XY Actuator type – Piezo
- Sensor type – Strain Gauge
- Z Range – > 16 μ
- Z Linearity – < 5 %
- Z sensor noise – < 5 nm
- Z feedback noise – < 0.2 nm∗
- Z Actuator Type – Piezo
- Z Sensor typ -e Strain Gauge
Light Lever AFM Force Sensor
Specification:
- Probe Types – Industry standard
- Probe insertion Manual – probe exchange tool
- Probe holding mechanism – Clip Vibrating mode piezo Electrical connector to probe
- Laser/Detector adjustment range – +/- 1.5 mm
- Adjustment resolution – 1 micron
- Minimum Probe to Objective – 25 mm
- Laser Type – 670 nm diode, < 5 mw
Detector - Type 4 quadrant
Band Width > 500 kHz
Signals Transmitted TL, BL, TR, BR
Gain Lo, High Settings - Probe sample angle – 10 degrees
Analog Electronics
Specification:
- Vibrating Mode
Freq Range 2 kHz – 800 kHz
Output Voltage 10 Vpp
Demod. Freq TBD - Z Feedback
Type PID
Bandwidth > 3 kHz
Sample Hold Yes
Voltage 0-150 V - XY Scan
Voltage 0 – 150 V
bandwidth > 200 Hz
Pan & Zoom 22 Bits - Tip Approach Cutoff > 20 μ sec.
Sample Holder
Specification:
- Type – Magnet
- Max Lateral Dimensions – 1 inch
- Max. Height – 0.25 inch
Z Motion
Specification:
- Type – Direct Drive
- Range – 25 mm
- Drive Type – Stepper Motor
- Min. Step Size – 330 nm
- Slew Rate – 8 mm/minute
- Limit Switch – Top, Bottom
- Control – Software – rate, step size
XY Translator
Specification:
- Probe Types – Industry standard
- Probe insertion Manual – probe exchange tool
- Probe holding mechanism – Clip Vibrating mode piezo Electrical connector to probe
- Laser/Detector adjustment range – +/- 1.5 mm
- Adjustment resolution – 1 micron
- Minimum Probe to Objective – 25 mm
- Laser Type – 670 nm diode, < 5 mw
Detector - Type 4 quadrant
Band Width > 500 kHz
Signals Transmitted TL, BL, TR, BR
Gain Lo, High Settings - Probe sample angle – 10 degrees